Global
“Collaborative Solutions Beyond 2010”
Hilton Hotel,
901 Camino Del Rio South
San Diego, CA 92108
GSC: 2008 Agenda
Wednesday, June 4 - To view/download Working Group Meetings and Agendas, CLICK HERE. Registration & lunch Welcome & Conference Overview Informal Industry Collaboration for Successful Development of STDF Fail Data Standards Ajay Khoche - Verigy Keynote speech Risto Puhakka - VLSI Research Break ITRS Roadmap for Test Roger Barth - Numonyx Model Based Standards Development: The Future Kevin Brady - National Josef Schraetzenstaller - Advantest Break Cocktail Reception & Dinner Thursday, June 5 - Mutual Challenges & Opportunities Breakfast Announcements Industry Panel Discussion Moderated by Rick Nelson - Test & Measurement World Guenther Jeserer - Multitest John Adams - Teradyne Josef Schraetzenstaller - Advantest Steve Wigley - LTX Stojan Kanev - SUSS MicroTec 10:00 AM OSAT Viewpoint Seyed Paransun - Amkor Break Cooperation Between EDA and Ed Malloy - Cadence Design for Test - Small Price to Pay on Silicon for High Product Quality Prasad Mantri - Design Automation Conference (DAC) & Sun Current Trends in Probe Ken Karklin - Semiconductor Wafer Test Workshop (SWTW) & Touchdown Technologies Lunch Why the Test Industry Needs Third Party Software Vendors to Succeed Taylor Scanlon - Pintail STARC SSTAG Activities and STIL Status in Hirofumi Kamitokusari - STARC Kenichi Sakai - Renesas Applying Open Platforms to Diverging Test Requirements Luke Schreier - National Instruments Break Test Strategy for High Quality, Low Cost and Time-to-Market Yasuhiko Tandou - Fujitsu Building World Class Supply Chains with Intel Capital Laura Oliphant - Intel Capital Test Productivity Ralf Schuster - Infineon Break Dinner Friday, June 6 - Enabling 2010 & Beyond Breakfast Docking & Interface Working Group: Status Update and Results Florian Putz - esmo Probe Card Order Placement Path & Form Standardization Fred Megna - MEC Academic Needs in Today's Semiconductor Industry Paul Roddy - Advantest Break PTIM Working Group Don Edenfeld - Intel Yield Enhancement Analysis Tools Working Group Keith Arnold - Pintail Closing remarks & acknowledgements Adjourn
Agenda is subject to change without notice.
Online GSC registration is now open at: www.regonline.com/gsc2008
Category Registration fee
Non-member $550 USD
Qualified press Complimentary
Working Group Meetings
Six STC Working Groups will be holding face-to-face meetings before or after GSC. For dates, times & agendas, click here.
GSC Sponsors
STC would like to thank Multitest elektronische Systeme GmbH & Advantest Corporation for their generous sponsorships:
Platinum Sponsor: Gold Sponsor:
Industry Collaboration Partners
STC endeavors to work closely with other industry groups. This year, we are very pleased to collaborate with these distinguished organizations:
STC welcomes Semiconductor Wafer Test Workshop (SWTW) as a Conference Alliance Partner. The next SWTW is June 8-11, 2008, in San Diego, CA. - STC also welcomes Design Automation Conference (DAC) as a Conference Alliance Partner. The next DAC is June 8-13, in Anaheim, CA.
To read Limor Fix's (45th DAC Chair) welcome, click here. STC is pleased to again have Future Fab as the Media Partner.
Contact Information
· General questions: Ms. Janey Chan, j.chan@advantest.com
· Registration-related questions: Ms. Judy Tonkin, judy@raspberrycom.com