STC Working Group Meetings
All GSC attendees are invited to participate in these working group meetings (STC members & non-members alike) to help drive open test standards, in support of the industry & academia.
Docking & Interface
Wednesday June 4, 10:00am to 12:00pm
- Status updates
- Agreed definitions & specifications
- Ongoing issues
- Next steps
Marketing
Wednesday June 4, 8:00pm to 10:00pm
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Optimizing member value & benefits
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What other activities should be supported
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What other working groups could be formed
- 2008 events calendar
- Updates, goals & objectives
- GSC 2008/2009
- Summary & strategy for next year
Portable Test Instrument Module (PTIM)
Wednesday June 4, 9:00am to 12:00pm
9:00 - 9:15 Introductions, Purpose, Last Meeting Review and Agenda Review 9:15 - 10:15 Integration Options - In-depth discussion of the PTIM integration options and the potential solutions for PXI based instrumentation – brainstorm options and distinguish among them with pro/con analysis
10:15 - 10:30 BREAK 10:30 - 11:45 Software Focus - Refine PTIM software integration goals - discuss potential instrument software control mechanisms in “typical”
ATE architectures, grade by ease of implementation 11:45 - 12:00 Wrap-up and Summarize Conclusions - If more time is available:
- Synchronization - Define and document PTIM goals for instrument timing synchronization and explore potential PXI implementations
- Calibration - Define and document PTIM goals for instrument calibration as the basis for a set of guidelines for developers
Probe Card
Friday June 6, 1:30pm to 4:00pm
- Yield enhancement for wafer test
- Degradation issues
- Upgrade work with intelligence sharing
- Extend test scope in wafer test for system in package
- High frequency test on wafer
- Analog & mixed-signal
- Open discussion for massive parallel test for SoC
University
Wednesday June 4, 9:00am to 10:00am
The focus of this meeting will be on soliciting feedback from the industry and academia on issues and challenges that these two groups are facing. Industry members, as well as academia members, are encouraged to participate. Industry, here is your opportunity to communicate your semiconductor test research and education needs to academia. Please attend this interactive session and be prepared to answer the following questions:
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What are the key research/education needs in the industry today?
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What minimum test engineering skills should be included in a "Test Engineering Certificate"
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What does the semiconductor industry want from academia?
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What are the key challenges/issues in academia today?
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What does academia want from the semiconductor industry?
Yield Enhancement Analysis Tools
Friday June 6, 1:30pm to 3:30pm
- Overview of working group mission
- Objectives & deliverables
- Task 1: Interface framework
- Test 2: Adaptive test interface requirements
- Key success criteria