Semiconductor Test Consortium
Home » Events » Global STC Conference-2007

GSC 2007: Collaborate * Innovate * Integrate

Conference a great success!

 

GSC: 2007 was held May 14-16, in Napa, CA.  The consensus is that we had a very successful event & achieved our main goal of bringing the majority of our corporate worldwide membership together. We had 102 registrants representing 61 companies from 7 countries. We had 20 technical & business oriented sessions during the conference, which ranged broadly from: Dan Hutcheson's keynote speech "From Microchips to Nanochips: How we got here and where do we go from here", to WWK's preliminary "Cost of Ownership Evaluation: The Economic Value of Open Architecture", the industry analysts panel discussion expressing Wall Street's viewpoint, leading semiconductor & ATE companies addressing their test challenges, expectations and solutions, six STC technical working group status updates and coming full circle, ending with IBM's "Early Lifecycle Yield Improvement of Nanometer Chips."

Thanks to all of the attendees, speakers, sponsors and table top exhibitors for making this global event such a success!

To view/download presentations from the GSC, click here.

       Gold Sponsor:                 Silver Sponsors:            Media Sponsor:       

    

                                                   

 

                                          Table Top Exhibitors: