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Global STC Conference Presentations

GSC Agenda

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Start Session
Monday May 14 Future Trends: A Global Perspective
9:30 AM Docking & Interface Working Group breakout session (Zinfandel room)
11:30 AM   Registration (Atlas Peak room)
12:00 PM   Lunch (Poolside Courtyard)
1:00 PM 1.1 STC welcome & BoD intro (Syrah & Merlot rooms)
1:08 PM 1.2 Conference overview
1:15 PM 1.3 Keynote speech - G. Dan Hutcheson (VLSI Research) - From Microchips to Nanochips: How we got here…and…where do we go from here
2:05 PM 1.4 ITRS Roadmap: Test Challenges Beyond 2010 - Roger Barth (Intel)
2:40 PM   Break
3:10 PM 1.5 Cost of Ownership - David Jimenez (Wright Williams & Kelly)
3:40 PM 1.6 Analysts panel discussion - led by G. Dan Hutcheson.     David Egan (Lehman Brothers), Mark FitzGerald (Banc of America Securities), Robert Maire (Needham & Co.) & Michael Winters (Bear, Stearns & Co.)
5:10 PM Open time for check-in & Table Top set up
6:00 PM   Reception & Table Tops (Poolside Courtyard)
7:00 PM Dinner (Poolside Courtyard)
Tuesday May 15 Test Challenges, Expectations & Solutions
8:00 AM   Breakfast & Table Tops (Atlas & Castle Peak rooms)
9:00 AM Announcements (Syrah & Merlot rooms)
9:10 AM 2.1 Texas Instruments - Billy Antheunisse  (Absent due to illness but submitted a presentation to post) - TI Analog Test Challenges
9:45 AM 2.2 Toshiba - Kazuhiro Sawada - User Perspective of Toshiba Semiconductor
10:20 AM 2.3 Renesas - Hideyuki Aoki - Renesas Strategy and Expectation of STC
10:55 AM   Break
11:25 AM 2.4 Intel - Jim Neeb - ATE to DUT Interconnect Challenges in Digital Applications
12:00 PM 2.5 Infineon - Klaus Luther - Future Trends for the ATE Industry from an IDM's Perspective
12:35 PM   Lunch & Table Tops (Atlas & Castle Peak rooms)
1:50 PM 2.6 FormFactor - Sergio Perez - Challenges of Probing Next Generation SoC
2:25 PM 2.7 Verigy - Debbora Ahlgren (Absent due to illness)
3:00 PM 2.8 Teradyne - Sten Peeters - Developing Standards while Fostering Innovation
3:35 PM   Break
4:00 PM 2.9 LTX - Steve Wigley - Impact of System in Package: A Total Supply Chain Perspective
4:35 PM 2.10 Credence - Itzik Goldberger - Test Challenges in the Consumer Age
5:10 PM 2.11 Advantest - Keith Lee - The Test Chip Challenge
5:45 PM   Dinner (Poolside Courtyard)
Wednesday May 16 Enabling the Ecosystem
8:00 AM   Breakfast (Atlas & Castle Peak rooms)
8:45 AM 3.1 Docking & Interface WG Overview & Status Update - Florian Putz
9:05 AM 3.2 OPENSTAR Solutions WG - Paul Roddy
9:25 AM 3.3 Probecard WG Report - Naoya Koiso
9:45 AM 3.4 Technical WG - Yuhai Ma
10:05 AM   Break
10:25 AM 3.5 IBM - Sanae Seike - Early Lifecycle Yield Improvement of Nanometer Chips Using Volume Yield Diagnostic Analysis
10:55 AM 3.6 University WG - Paul Roddy
11:15 AM 3.7 PTIM WG Status Report- Burnell G. West, Ph. D.
11:35 AM 3.8 Closing remarks, acknowledgements & raffle
11:50 AM Adjourn


1:30 PM                     PTIM Working Group breakout session (Zinfandel room)